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Reliability packaging testing and characterization of MEMS/MOEMS VI : 23-24 January 2007 San Jos
出版社：Bellingham, Wash. : SPIE, c2007.
ISBN：9780819465764
出版年：2007
作者：Hartzell,Allyson L.
资源类型：图书
细分类型：西文文献
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