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Reliability packaging testing and characterization of MEMS/MOEMS VIII : 28-29 January 2009 San J
出版社：Bellingham, Wash. : SPIE, c2008.
ISBN：9780819474520
出版年：2009
作者：Kullberg,Richard C.
资源类型：图书
细分类型：西文文献,馆内阅览
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