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Reliability packaging testing and characterization of MEMS/MOEMS and nanodevices X : 24-25 Januar
出版社：Bellingham, Wash. : SPIE, c2011.
ISBN：9780819484659
出版年：2011
作者：Garcia-Blanco,Sonia.
资源类型：图书
细分类型：西文文献
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