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Reliability packaging testing and characterization of MEMS/MOEMS VII : 21-22 January 2008 San Jo
出版社：Bellingham, Wash. : SPIE, c2008.
ISBN：0819470597
出版年：2008
作者：Hartzell,Allyson L.
资源类型：图书
细分类型：西文文献,馆内阅览
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