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Reliability packaging testing and characterization of MEMS/MOEMS V : 25-26 January 2006 San Jose
出版社：Bellingham, Wash. : SPIE, c2006.
ISBN：0819461539
出版年：2006
作者：Ramesham,Rajeshuni.
资源类型：图书
细分类型：西文文献
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