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Reliability packaging testing and characterization of MEMS/MOEMS and nanodevices XI : 23-24 Janua
出版社：Bellingham, Wash. : SPIE, c2012.
ISBN：9780819488930
出版年：2012
作者：Garcia-Blanco,Sonia M.
资源类型：图书
细分类型：西文文献
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