Metal Impurities in Silicon-Device Fabrication

EISBN:9783642571213
PISBN:9783642629655
出版社:Springer Berlin Heidelberg
出版类型:Monograph
出版时间:2000
作者:Klaus Graff
主题词:Optical and Electronic Materials,Electronics and Microelectronics,Instrumentation,Characterization and Evaluation of Materials
语种:英语
所属数据库:SpringerLink电子图书
相关推荐

Metal Impurities in Silicon-Device Fabrication

  • 作者:Klaus Graff
  • EISBN:9783642975936
  • 出版社:Springer Berlin Heidelberg
  • 出版时间:1995

Metal Impurities in Silicon-Device Fabrication

  • 作者:Klaus Graff
  • EISBN:9783642975936
  • 出版社:Springer Berlin Heidelberg
  • 出版时间:1995

Metal Impurities in Silicon-Device Fabrication

  • 作者:Klaus Graff
  • EISBN:9783642571213
  • 出版社:Springer Berlin Heidelberg
  • 出版时间:2000

Metal Impurities in Silicon- and Germanium-Based Technologies

  • 作者:Cor Claeys,Eddy Simoen
  • EISBN:9783319939254
  • 出版社:Springer International Publishing
  • 出版时间:2018

Ion Implantation: Basics to Device Fabrication

  • 作者:Emanuele Rimini
  • EISBN:9781461522591
  • 出版社:Springer US
  • 出版时间:1995

Defects and Impurities in Silicon Materials

  • 作者:Yutaka Yoshida,Guido Langouche
  • EISBN:9784431558002
  • 出版社:Springer Japan
  • 出版时间:2015