登录
 机构网站
  1. 首页
  2. 馆藏纸本
  3. 图书详情
...

2017 Far East NDT New Technology & Application Forum (FENDT 2017) : Xi''an China 22-24 June 2017.
出版社：Piscataway, N.J. : IEEE, 2017.
ISBN：9781538616161
出版年：2017
作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
资源类型：图书
细分类型：西文文献
1浏览量
 馆际互借
访问借阅管理系统
相关推荐
...

2016 IEEE Far East NDT New Technology & Application Forum (FENDT 2016) : Nanchang, China, 22-24 June
  • 作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
  • ISBN：9781509026654
  • 出版社：Piscataway, N.J. : IEEE Computer Society, c2016.
  • 出版年：2016
...

2018 IEEE Far East NDT New Technology & Application Forum (FENDT 2018) : Xiamen, China, 6-8 July 201
  • 作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
  • ISBN：9781538662311
  • 出版社：Piscataway, N.J. : IEEE, 2018.
  • 出版年：2018
...

2015 IEEE Far East NDT New Technology & Application Forum (FENDT 2015) : Zhuhai, China, 28-31 May 20
  • 作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
  • ISBN：9781467370028
  • 出版社：Piscataway, N.J. : IEEE, c2015.
  • 出版年：2015
...

2017 E-Health and Bioengineering Conference (EHB 2017) : Sinaia, Romania, 22-24 June 2017.
  • 作者：E-Health and Bioengineering Conference
  • ISBN：9781538615140
  • 出版社：Piscataway, N.J. : IEEE Computer Society, c2017.
  • 出版年：2017
...

2017 Electronic Congress (E-CON UNI 2017) : Lima, Peru, 22-24 November 2017.
  • 作者：Electronic Congress
  • ISBN：9781538622797
  • 出版社：Piscataway, N.J. : IEEE, 2017.
  • 出版年：2017
...

2013 Far East Forum on Nondestructive Evaluation/Testing (FENDT 2013) : new technology & application
  • 作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
  • ISBN：9781467360173
  • 出版社：Piscataway, N.J. : IEEE, c2013.
  • 出版年：2013