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2018 IEEE Far East NDT New Technology & Application Forum (FENDT 2018) : Xiamen China 6-8 July 201
出版社：Piscataway, N.J. : IEEE, 2018.
ISBN：9781538662311
出版年：2018
作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
资源类型：图书
细分类型：西文文献
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