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2016 IEEE Far East NDT New Technology & Application Forum (FENDT 2016) : Nanchang China 22-24 June
出版社：Piscataway, N.J. : IEEE Computer Society, c2016.
ISBN：9781509026654
出版年：2016
作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
资源类型：图书
细分类型：西文文献
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