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2015 IEEE Far East NDT New Technology & Application Forum (FENDT 2015) : Zhuhai China 28-31 May 20
出版社：Piscataway, N.J. : IEEE, c2015.
ISBN：9781467370028
出版年：2015
作者：International Conference on Far East Forum on Nondestructive Evaluation/Testing
资源类型：图书
细分类型：西文文献
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