Electron-beam X-ray and ion-beam technology : submicrometer lithographies VIII : 1-3 March 1989 S

出版社:Bellingham, Wash., USA : SPIE, c1989.
ISBN:0819401242
出版年:1989
作者:Yanof,Arnold W.
资源类型:图书
细分类型:西文文献
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