Advances in metrology for x-ray and EUV optics : 2-3 August 2005 San Diego California USA

出版社:Bellingham, Wash. : SPIE, c2005.
ISBN:0819459267
出版年:2005
作者:Assoufid,Lahsen.
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细分类型:西文文献,馆内阅览
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