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Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on F
出版社：Melville, N. Y. : American Institute of Physics, 2009.
ISBN：9780735407121
出版年：2009
作者：International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
资源类型：图书,随书光盘
细分类型：西文文献,随书光盘
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