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Frontiers of characterization and metrology for nanoelectronics 2011 : Grenoble France 23-26 May
出版社：Melville, N.Y. : American Institute of Physics, 2011.
ISBN：9780735409651
出版年：2011
作者：International Conference on Frontiers of Characterization and Metrology for Nanoelectronics :
资源类型：图书
细分类型：西文文献
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