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《Method of alignment error control in free-form surface metrology with the tilted-wave-interferometer》

  • 来源专题：光电技术研究所所级服务
  • 编译者： feng22051010
  • 发布时间：2016-04-16

  • <Previous ArticleNext Article> Instrumentation, Techniques, and Measurement Method of alignment error control in free-form surface metrology with the tilted-wave-interferometer . Jia Li; Hua Shen; Rihong Zhu [+ - ] Author Affiliations Jia Li, Hua Shen, Rihong ZhuNanjing University of Science and Technology, School of Electronic Engineering and Photo-Electric Technology, 200 Xiaoling Wei Street, Nanjing, Jiangsu Province 210094, China Opt. Eng . ...

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