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Scanning Electron Microscopy and X-Ray Microanalysis
EISBN：9781461502159
PISBN：9780306472923
出版社：Springer US
出版类型：Graduate/advanced undergraduate textbook
出版时间：2003
版次：3rd ed. 2003
作者：Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael
主题词：Materials Science,Characterization and Evaluation of Materials,Materials Science,general,Science,Humanities and Social Sciences,multidisciplinary,Biological Microscopy,Surfaces and Interfaces,Thin Films,Nanotechnology
语种：英语
所属数据库：SpringerLink电子图书(1815-2004)
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