Impact of Electron and Scanning Probe Microscopy on Materials Research

EISBN:9789401144513
PISBN:9780792359401
出版社:Springer Netherlands
出版类型:Contributed volume
出版时间:1999
作者:David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
主题词:Characterization and Evaluation of Materials,Physical Chemistry,Condensed Matter Physics,Surfaces and Interfaces,Thin Films,Inorganic Chemistry
语种:英语
所属数据库:SpringerLink电子图书
丛书题名:NATO ASI Series
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