High Quality Test Pattern Generation and Boolean Satisfiability

EISBN:9781441999764
PISBN:9781441999757
出版社:Springer US
出版类型:Monograph
出版时间:2012
作者:Stephan Eggersglüß,Rolf Drechsler
主题词:Circuits and Systems,Electronics and Microelectronics,Instrumentation,Processor Architectures
语种:英语
所属数据库:SpringerLink电子图书
相关推荐

Test Pattern Generation using Boolean Proof Engines

  • 作者:Rolf Drechsler,Stephan Eggersglüβ,Görschwin Fey,Daniel Tille
  • EISBN:9789048123605
  • 出版社:Springer Netherlands
  • 出版时间:2009

Bridging Constraint Satisfaction and Boolean Satisfiability

  • 作者:Justyna Petke
  • EISBN:9783319218106
  • 出版社:Springer International Publishing
  • 出版时间:2015

An Artificial Intelligence Approach to Test Generation

  • 作者:Narinder Singh
  • EISBN:9781461319795
  • 出版社:Springer US
  • 出版时间:1987

Automatic Generation of Combinatorial Test Data

  • 作者:Jian Zhang,Zhiqiang Zhang,Feifei Ma
  • EISBN:9783662434291
  • 出版社:Springer Berlin Heidelberg
  • 出版时间:2014

An Artificial Intelligence Approach to Test Generation

  • 作者:Narinder Singh
  • EISBN:9781461319795
  • 出版社:Springer US
  • 出版时间:1987

Assessing Fault Model and Test Quality

  • 作者:Kenneth M. Butler,M. Ray Mercer
  • EISBN:9781461536062
  • 出版社:Springer US
  • 出版时间:1992