登录
 机构网站
  1. 首页
  2. 馆藏纸本
  3. 图书详情
...

Testing reliability and application of micro- and nano-material systems IV : 28 February-2 March 2
出版社：Bellingham, Wash. : SPIE, c2006.
ISBN：0819462284
出版年：2006
作者：Geer,Robert E.
资源类型：图书
细分类型：西文文献
1浏览量
 馆际互借
访问借阅管理系统
相关推荐
...

Testing, reliability, and application of micro- and nano-material systems : 3-5 March 2003, San Dieg
  • 作者：Meyendorf,Norbert.
  • ISBN：0819448508
  • 出版社：Bellingham, Wash. : SPIE, c2003.
  • 出版年：2003
...

Testing, reliability, and application of micro- and nano-material systems II : 15-17 March 2004, San
  • 作者：Meyendorf,Norbert.
  • ISBN：0819453099
  • 出版社：Bellingham, Wash. : SPIE, c2004.
  • 出版年：2004
...

Testing, reliability, and application of micro- and nano- material systems III : 8-10 March 2005, Sa
  • 作者：Geer,Robert E.
  • ISBN：0819457477
  • 出版社：Bellingham, Wash. : SPIE, c2005.
  • 出版年：2005
...

Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California,
  • 作者：Sturtevant,John L.
  • ISBN：0819457337
  • 出版社：Bellingham, Wash. : SPIE, c2005.
  • 出版年：2005
...

Advances in resist materials and processing technology XXVIII : 28 February-2 March 2011, San Jose,
  • 作者：Allen,Robert D.
  • ISBN：9780819485311
  • 出版社：Bellingham, Wash. : SPIE, c2011.
  • 出版年：2011
...

Design for manufacturability through design-process integration : 28 February-2 March 2007, San Jose
  • 作者：Singh,Vivek K.
  • ISBN：9780819466402
  • 出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2007.
  • 出版年：2007