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Eighth International Symposium on Laser Metrology : macro- micro- and nano-technologies applied in
出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2005.
ISBN：0819457574
出版年：2005
作者：International Symposium on Laser Metrology
资源类型：图书
细分类型：西文文献
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