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Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
出版社：Boston, New York [etc.] : Houghton Mifflin Company 1920
ISBN：赠阅
出版年：1920
作者：Terman,Lewis Madison,
资源类型：图书
细分类型：西文文献
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Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
  • 作者：Terman,Lewis Madison,
  • 出版社：Boston, New York [etc.] : Houghton Mifflin Company 1920
  • 出版年：1920
...

The Stanford revision and extension of the Binet-Simon scale for measuring intelligence,
  • 作者：Terman,Lewis Madison. [from old catalog]
  • ISBN：赠阅
  • 出版社：Baltimore, Warwick & York, inc., 1917.
  • 出版年：1917
...

The Stanford revision and extension of the Binet-Simon scale for measuring intelligence,
  • 作者：Terman,Lewis Madison. [from old catalog]
  • 出版社：Baltimore, Warwick & York, inc., 1917.
  • 出版年：1917
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Herring revision of the Binet-Simon tests, examination manual: form A,
  • 作者：Herring,John P.
  • ISBN：赠阅
  • 出版社：Yonkers-on-Hudson, N.Y., World Book Company, 1923.
  • 出版年：1923
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Herring revision of the Binet-Simon tests, examination manual: form A,
  • 作者：Herring,John P.
  • 出版社：Yonkers-on-Hudson, N.Y., World Book Company, 1923.
  • 出版年：1923
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Measuring intelligence : a guide to the administration of the new revised Stanford-Binet tests of in
  • 作者：Terman,Lewis Madison,
  • 出版社：Boston ; New York : Houghton Mifflin, c1937.
  • 出版年：1950