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Measuring intelligence : a guide to the administration of the new revised Stanford-Binet tests of in
出版社：Boston ; New York : Houghton Mifflin, c1937.
ISBN：赠阅
出版年：1950
作者：Terman,Lewis Madison,
资源类型：图书
细分类型：西文文献
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Measuring intelligence : a guide to the administration of the new revised Stanford-Binet tests of in
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The effect of familiarity with the examiner upon Stanford-Binet test performance.
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