Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992 Somers

出版社:Bellingham, Wash. : SPIE, c1992.
ISBN:0819408395
出版年:1992
作者:Glembocki,Orest.J.
资源类型:图书
细分类型:西文文献
相关推荐

Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newpo

  • 作者:Glembocki,O. J.
  • ISBN:0892529814
  • 出版社:Bellingham, Wash., U.S.A. : The Society, c1988.
  • 出版年:1988

Next-generation spectroscopic technologies IV : 25-26 April 2011, Orlando, Florida, United States

  • 作者:Crocombe,Richard A.
  • ISBN:9780819486066
  • 出版社:Bellingham, Wash. : SPIE, c2011.
  • 出版年:2011

Physics and simulation of optoelectronic devices : 25-26 March 1992, Somerset, New Jersey

  • 作者:Yevick,David.
  • ISBN:0819408409
  • 出版社:Bellingham, Wash. : SPIE, c1992.
  • 出版年:1992

Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los

  • 作者:Pollak,Fred H.
  • ISBN:0892525592
  • 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985.
  • 出版年:1985

Spectroscopic characterization techniques for semiconductor technology II : Jan. 21-22, 1985, Los An

  • 作者:Pollak,Fred H.
  • ISBN:0892525592
  • 出版社:Bellingham, c1985
  • 出版年:1985

Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambrid

  • 作者:Pollak,Fred H.
  • ISBN:0892524871
  • 出版社:Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, c1984.
  • 出版年:1984