Spectroscopic characterization techniques for semiconductor technology II : Jan. 21-22 1985 Los An

出版社:Bellingham, c1985
ISBN:0892525592
出版年:1985
作者:Pollak,Fred H.
资源类型:图书
细分类型:西文文献
相关推荐

Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los

  • 作者:Pollak,Fred H.
  • ISBN:0892525592
  • 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985.
  • 出版年:1985

Measurement and effects of surface defects and quality of polish : Jan. 21-22, 1985, Los Angeles, Ca

  • 作者:Baker,Lionel R.
  • ISBN:0892525606
  • 出版社:Bellingham : SPIE, 1985.
  • 出版年:1985

Optical technologies for communication satellite applications : 21-22 Jan. 1986, Los Angeles, Califo

  • 作者:Bhasin,Kul
  • ISBN:0892526513
  • 出版社:Bellingham, c1986
  • 出版年:1986

Practical holography : 21-22 Jan. 1986, Los Angeles, California

  • 作者:Jeong,Tung H.
  • ISBN:0892526505 15.50
  • 出版社:Bellingham, c1986
  • 出版年:1986

Nonlinear optics and application : 21-22 Jan. 1986, Los Angeles, Calif.

  • 作者:Yeh,Pochi
  • ISBN:0892526483 18.80
  • 出版社:Bellingham, c1986
  • 出版年:1986

Highly parallel signal processing architectures : 21-22 Jan. 1986, Los Angeles, California

  • 作者:Bromley,Keith
  • ISBN:0892526491
  • 出版社:Bellingham, c1986
  • 出版年:1986