Industrial X-Ray Computed Tomography

EISBN:9783319595733
PISBN:9783319595719
出版社:Springer International Publishing
出版类型:Professional book
出版时间:2018
版次:1st ed. 2018
作者:Simone Carmignato,Wim Dewulf,Richard Leach
主题词:Materials Science,Characterization and Evaluation of Materials,Optical and Electronic Materials,Atomic,Molecular,Optical and Plasma Physics
语种:英语
所属数据库:SpringerLink电子图书
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