An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

EISBN：9781681740881

PISBN：9781681740249

出版社：IOP Publishing

出版时间：2015

作者：Sarah Fearn

主题词：物理学

语种：英语

所属数据库：IOP电子图书

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

作者：Fearn,S;Sarah Fearn
EISBN：9781681740881
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Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry

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EISBN：9783658285029
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Time-of-Flight Mass Spectrometry and its Applications

作者：Schlag,E.W.
PISBN：9780444818751
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Time-Of-Flight Mass Spectrometry

作者：Price,D.
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Secondary Ion Mass Spectrometry SIMS II

作者：A. Benninghoven,C.A. Jr. Evans,R.A. Powell,R. Shimizu,H.A. Storms
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出版社：Springer Berlin Heidelberg
出版时间：1979

Secondary Ion Mass Spectrometry SIMS V

作者：Alfred Benninghoven,Richard J. Colton,David S. Simons,Helmut W. Werner
EISBN：9783642827242
出版社：Springer Berlin Heidelberg
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