Long-Term Reliability of Nanometer VLSI Systems

EISBN:9783030261726
PISBN:9783030261719
出版社:Springer International Publishing
出版类型:Monograph
出版时间:2019
版次:1st ed. 2019
作者:Sheldon Tan,Mehdi Tahoori,Taeyoung Kim,Shengcheng Wang,Zeyu Sun,Saman Kiamehr
主题词:Physics,Electronic Circuits and Devices,Circuits and Systems,Processor Architectures
语种:英语
所属数据库:SpringerLink电子图书
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