Contactless VLSI measurement and testing techniques

出版社:Cham : Springer, 2018.
ISBN:9783319696720
出版年:2018
作者:Sayil,Selahattin.
资源类型:图书
细分类型:西文文献
相关推荐

VLSI : testing & validation techniques

  • 作者:Reghbati,Hassan K.
  • ISBN:0444879471
  • 出版社:Wash., D. C. : IEEE Computer Society, c1985.
  • 出版年:1985

Tutorial--VLSI testing & validation techniques

  • 作者:Reghbati,Hassan K.,
  • ISBN:0444879471
  • 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society,
  • 出版年:1985

VLSI testing : digital and mixed analogue/digital techniques

  • 作者:Hurst,Stanley L.
  • ISBN:0852969015
  • 出版社:London : The Institute of Electrical Engineers, c1998.
  • 出版年:1998

Tutorial--VLSI testing & validation techniques

  • 作者:Reghbati,Hassan K.
  • ISBN:0818606681
  • 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society,,Wash. : IEEE Computer Society, 1985
  • 出版年:1985

Optical measurement and nondestructive testing : techniques and applications

  • 作者:Song,F.
  • ISBN:0819438928
  • 出版社:Bellingham : SPIE, 2001.
  • 出版年:2001

VLSI testing

  • 作者:Williams,T. W
  • ISBN:0444878904
  • 出版社:Amsterdam : North-Holland, 1986
  • 出版年:1986