2008 International Symposium on VLSI Design Automation and Test (VLSI-DAT): April 23-25 2008 Amb

出版社:Hsinchu, Taiwan : Industrial Technology Research Group ; Piscataway, N.J. : IEEE, c2008.
ISBN:9781424416165
出版年:2008
作者:International Symposium on VLSI Design,Automation,and Test
资源类型:图书
细分类型:西文文献
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