Reliability of organic compounds in microelectronics and optoelectronics : from physics-of-failure t

出版社:Cham : Springer, 2022.
ISBN:9783030815752
出版年:2022
作者:Driel,Willem Dirk van,
资源类型:图书
细分类型:西文文献
相关推荐

Progress in silicon materials : from microelectronics to photovoltaics and optoelectronics

  • 作者:Yang,Deren.
  • ISBN:7030131150
  • 出版社:Beijing : Science Pr. ; c2004.
  • 出版年:2004

In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing

  • 作者:Kissinger,Gudrun.
  • ISBN:0819441074
  • 出版社:Bellingham, Wash. : SPIE, c2001.
  • 出版年:2001

Reliability physics and engineering : time-to-failure modeling

  • 作者:McPherson,J. W.
  • ISBN:9783319001210
  • 出版社:Cham : Springer, c2013.
  • 出版年:2013

Reliability physics and engineering : time-to-failure modeling

  • 作者:McPherson,J. W.
  • ISBN:9783319936826
  • 出版社:Cham, Switzerland : Springer, 2019.
  • 出版年:2019

Progress in silicon materials : from microelectronics to photovoltaics and optoelectronics = 硅材

  • 作者:Yang,Deren
  • ISBN:7030131150
  • 出版社:北京 : 科学出版社, 2004
  • 出版年:2004

Nanotechnology for microelectronics and optoelectronics

  • 作者:Martínez-Duart,J. M.
  • ISBN:9780080445533
  • 出版社:Amsterdam : Elsevier, c2006.
  • 出版年:2006