Image assessment & specification : seminar-in-depth, May 20-22, 1974, Rochester, New York

Image assessment & specification : seminar-in-depth May 20-22 1974 Rochester New York

出版社：Palos Verdes Estates, Calif. : Society of Photo-Optical Instrumentation Engineers, c1974.

出版年：1974

作者：Dutton,David.

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Image assessment and specification : proceedings of the Society, May 20-22, 1974, Rochester, N.Y.

作者：Dutton,David
ISBN：CNY3.70
出版社：Redondon Beach, c1974
出版年：1974

Image assessment and specification : proceedings of the Society, May 20-22, 1974, Rochester, N.Y.

作者：Dutton,David
出版社：Redondon Beach, c1974
出版年：1974

Image Assessment & Specification : Proceedings of SPIE,May 20-22,1974,New York

出版社：California : SPIE, 1974.
出版年：1974

Developments in laser technology; Seminar-in Depth, Rochester, New York, Nov. 17-18, 1969; proceedin

作者：Seminar-in Depth on Developments in Laser Technology
ISBN：￥2.30
出版社：Calif : SPIE ; 1969.
出版年：1969

Developments in laser technology; Seminar-in Depth, Rochester, New York, Nov. 17-18, 1969; proceedin

作者：Seminar-in Depth on Developments in Laser Technology
出版社：Calif : SPIE ; 1969.
出版年：1969

2013 IEEE Western New York Image Processing Workshop (WNYIPW 2013) : Rochester, New York, USA, 22 No

作者：Western New York Image Processing Workshop
ISBN：9781479930272
出版社：Piscataway, N.J. : IEEE Computer Society, c2013.
出版年：2013