Advanced semiconductor processing and characterization of electronic and optical materials : January

出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1984.
ISBN:0892524987
出版年:1984
作者:Sadana,Devendra K.
资源类型:图书
细分类型:西文文献
相关推荐

Nanoporous materials : advanced techniques for characterization, modeling, and processing

  • 作者:Kanellopoulos,Nick.
  • ISBN:9781439811047
  • 出版社:Boca Raton, Fla. : CRC Press ; London : Taylor & Francis [distributor], 2011.
  • 出版年:2011

Ultrastructure processing of advanced structural and electronic materials

  • 作者:Hench,L. L.
  • ISBN:84014835 36
  • 出版社:Park Ridge, N.J. : Noyes Publications, c1984.
  • 出版年:1984

Ultrastructure processing of advanced structural and electronic materials

  • 作者:Hench,L. L.
  • ISBN:0815510047
  • 出版社:Park Ridge : Noyes, c1984
  • 出版年:1984

Ultrastructure processing of advanced structural and electronic materials

  • 作者:Hench,L. L.
  • ISBN:84014835
  • 出版社:Park Ridge, N.J. : Noyes Publications, c1984.
  • 出版年:1984

Characterization of semiconductor materials

  • 作者:Kane,Philip F.,
  • ISBN:RMB2.50
  • 出版社:New York, McGraw-Hill 1970.
  • 出版年:1970

Characterization of semiconductor materials

  • 作者:Kane,Philip F.,
  • 出版社:New York, McGraw-Hill 1970.
  • 出版年:1970