Microscopy of Materials : Modern Imaging Methods Using Electron X-ray and Ion Beams

出版社:London : Macmillan, 1975.
ISBN:333154959
出版年:1975
作者:D. K. Bowen,C. R. Hall
资源类型:期刊(装订的)
细分类型:西文文献
相关推荐

Microscopy of materials : modern imaging methods using electron, X-ray and ion beams

  • 作者:Bowen,D.K.
  • ISBN:¥1.70
  • 出版社:London : Macmillan ; 1975.
  • 出版年:1975

Microscopy of materials : modern imaging methods using electron, X-ray and ion beams

  • 作者:Bowen,D.K.
  • 出版社:London : Macmillan, 1980,London : Macmillan ; 1975.
  • 出版年:1975

Microscopy of materials : modern imaging methods using electron, x-ray and ion beams

  • 作者:Bowen,D. Keith
  • ISBN:0333154959
  • 出版社:London [etc.] : MacMillan, 1975.
  • 出版年:1975

Microscopy of Materials: Modern Imaging Methods Using Electron,X-ray and Lon Beams

  • 作者:Bowen,D.K.
  • ISBN:CNY1.70
  • 出版社:London : Macmillan, 1975.
  • 出版年:1975

Microscopy of Materials: Modern Imaging Methods Using Electron,X-ray and Lon Beams

  • 作者:Bowen,D.K.
  • 出版社:London : Macmillan, 1975.
  • 出版年:1975

Scanning electron microscopy and X-ray microanalysis

  • 作者:Goldstein,Joseph I.
  • ISBN:9781493966745
  • 出版社:New York, NY : Springer, 2018.
  • 出版年:2018