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2007 International Conference on Microelectronic Test Structures : Bunkyo-ku Japan 19-22 March 200
出版社：Piscataway, NJ : IEEE, c2007.
ISBN：142440780X
出版年：2007
作者：International Conference on Microelectronic Test Structures
资源类型：图书
细分类型：西文文献
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