2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010) : Ky

出版社:Los Alamitos, Calif. : IEEE Computer Society Press, c2010.
ISBN:9781424484478
出版年:2010
作者:IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
资源类型:图书
细分类型:西文文献
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