Machine vision systems for inspection and metrology VIII

出版社:Bellingham : SPIE, 1999.
ISBN:0819434299
出版年:1999
作者:Miller,J. W. V.
资源类型:图书
细分类型:西文文献
相关推荐

Machine vision systems for inspection and metrology VII

  • 作者:Batchelor,B. G.
  • ISBN:0819429821
  • 出版社:Bellingham : SPIE, 1998.
  • 出版年:1998

Machine vision systems for inspection and metrology VIII : 21-22 Sept., 1999, Boston, Mass.

  • 作者:Batchelor,Bruce G.,
  • ISBN:0819434299
  • 出版社:Bellingham, Wash. : SPIE, c1999.
  • 出版年:1999

Machine vision applications in industrial inspection VIII

  • 作者:Tobin,K. W.
  • ISBN:0819435848
  • 出版社:Bellingham : SPIE, 2000.
  • 出版年:2000

Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October

  • 作者:Harding,Kevin G.
  • ISBN:081944295X
  • 出版社:Bellingham, Washington : SPIE, c2002.,Bellingham, Wash. : SPIE, c2002.
  • 出版年:2002

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 Nov. 2001, B

  • 作者:Harding,Kevin G.,
  • ISBN:0819438545
  • 出版社:Bellingham, Wash. : SPIE, c2001.
  • 出版年:2001

Machine vision systems for inspection and metrology VII : 4-5 Nov. 1998, Boston, Mass.

  • 作者:Batchelor,Bruce G.,
  • ISBN:0819429821
  • 出版社:Bellingham, Wash. : SPIE, c1998.
  • 出版年:1998