X-ray free-electron lasers : beam diagnostics beamline instrumentation and applications II : 18-19

出版社:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2014.
ISBN:9871628412374
出版年:2014
作者:Hau-Riege,Stefan P.
资源类型:图书
细分类型:西文文献
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