2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET 2016) : Austin, Texas, USA, 16

2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET 2016) : Austin Texas USA 16

出版社：Piscataway, N.J. : IEEE, 2016.

ISBN：9781509001309

出版年：2016

作者：IEEE/ACM International Workshop on Metamorphic Testing

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