Optoelectronic metrology : 28-30 Sept. 1998, Lancut, Poland

Optoelectronic metrology : 28-30 Sept. 1998 Lancut Poland

出版社：Bellingham, Wash. : SPIE, c1998.

ISBN：0819436445

出版年：1998

作者：Owsik,Jan,

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细分类型：西文文献

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