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2000 5th International Workshop on Statistical Metrology June 11 2000 Hawaii
出版社：Piscataway, N.J. : IEEE Opterations Center, c2000.
ISBN：0780358961
出版年：2000
作者：International Workshop on Statistical Metrology
资源类型：图书
细分类型：西文文献
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Proceedings : 5th Hawaii International Conference on System Sciences, Jan, 11-13, 1972, Honolulu, Ha
  • 作者：Hawaii International Conference on System Sciences
  • 出版社：[S.l.] : Western Periodicals, 1972.
  • 出版年：1972