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2009 International Conference on Test and Measurement : ICTM 2009 Hong Kong 5-6 December 2009.
出版社：Piscataway, N.J. : IEEE, c2009.
ISBN：9781424446995
出版年：2009
作者：International Conference on Test and Measurement
资源类型：图书
细分类型：西文文献
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