Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles,

Measurement and effects of surface defects and quality of polish : January 21-22 1985 Los Angeles

出版社：Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985.

ISBN：0892525606

出版年：1985

作者：Baker,L. R.

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Measurement and effects of surface defects and quality of polish : Jan. 21-22, 1985, Los Angeles, Ca

作者：Baker,Lionel R.
ISBN：0892525606
出版社：Bellingham : SPIE, 1985.
出版年：1985

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出版社：Bellingham, Wash., USA : SPIE-International Society for Optical Engineering, c1986.
出版年：1986

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出版社：Bellingham, Wash., USA : SPIE, c1993.
出版年：1993

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出版社：Bellingham, Wash., USA : SPIE, c1993.
出版年：1993

Amorphous semiconductors for microelectronics : January 21-22, 1986, Los Angeles, California

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出版社：Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.
出版年：1986

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作者：Ruda,Mitchell C.
ISBN：0892526432
出版社：Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.
出版年：1986