Trace analysis of semiconductor materials.

出版社:Oxford ; New York : Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York],
ISBN:RMB1.80
出版年:1964
作者:Cali,J. Paul.,
资源类型:图书
细分类型:西文文献
相关推荐

Trace analysis of semiconductor materials.

  • 作者:Cali,J. Paul.,
  • 出版社:Oxford ; New York : Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York],
  • 出版年:1964

Trace analysis of semiconductor materials

  • 作者:Cali,J. Paul ed.
  • 出版社:Oxford : Pergamon, 1964.,Pergamon 1964
  • 出版年:1964

Trace Analysis of Semiconductor Materials

  • 作者:Cali,J Paul.
  • ISBN:CNY1.80
  • 出版社:Oxford,Lonodn,New York : Pergamon Press, 1964.
  • 出版年:1964

Trace Analysis of Semiconductor Materials

  • 作者:J. Paul Cali
  • 出版社:Oxford : Pergamon Press, 1964.,Oxford,Lonodn,New York : Pergamon Press, 1964.
  • 出版年:1964

Ultra-pure and semiconductor materials.

  • 作者:Societe Generale Metallurgique de Hoboken.
  • 出版社:Hoboken : [s.n., 19--],Hoboken : [s.n.], [19??]

Electron beam analysis of materials.

  • 作者:Loretto,M.M.
  • ISBN:0412477904
  • 出版社:London : Chapman & Hall, 1994.
  • 出版年:1994