Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan, 28-30 May 2012

Stress induced phenomena and reliability in 3D microelectronics : Kyoto Japan 28-30 May 2012

出版社：Melville, New York : AIP Publishing, 2014.

ISBN：9781632667410

出版年：2014

作者：International Workshop on Stress-Induced Phenomena in Microelectronics

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