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2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET 2017) : Buenos Aires Argentina
出版社：Piscataway, N.J. : IEEE Computer Society, c2017.
ISBN：9781538604250
出版年：2017
作者：IEEE/ACM International Workshop on Metamorphic Testing
资源类型：图书
细分类型：西文文献
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